Optical Element for X-ray Microscopy

نویسنده

  • G Chadzitaskos
چکیده

We present a proposal for a X-ray optical element suitable for X-ray microscopy and other X-ray-based display systems. Its principle is based on the Fresnel lenses condition and the Bragg condition for X– ray scattering on a slice of monocrystal. These conditions are fulfilled simultaneously due to a properly machined shape of the monocrystal with a stress at its ends.

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تاریخ انتشار 2008